A line process approach to penalized maximum-likelihood reconstruction for 3D SPECT

Lloyd Arrowood, Sanghyeb Lee, Jens Gregor

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Traditional SPECT imaging requires a trade-off between resolution and sensitivity. We show that it is possible to eliminate this trade-off and come close to achieving both goals simultaneously. Abstractly, small pinhole data is used to improve the resolution of co-registered large pinhole data which has higher sensitivity. Mathematically, the former is used to initialize a set of line processes that control the extent to which a truncated quadratic prior is applied to the latter. The idea builds on previous work by others on anatomic priors.

Original languageEnglish (US)
Title of host publication2013 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781479905348
DOIs
StatePublished - Jan 1 2013
Externally publishedYes
Event2013 60th IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013 - Seoul, Korea, Republic of
Duration: Oct 27 2013Nov 2 2013

Other

Other2013 60th IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013
CountryKorea, Republic of
CitySeoul
Period10/27/1311/2/13

Fingerprint

pinholes
Single-Photon Emission-Computed Tomography
sensitivity

All Science Journal Classification (ASJC) codes

  • Radiation
  • Nuclear and High Energy Physics
  • Radiology Nuclear Medicine and imaging

Cite this

Arrowood, L., Lee, S., & Gregor, J. (2013). A line process approach to penalized maximum-likelihood reconstruction for 3D SPECT. In 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013 [6829243] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NSSMIC.2013.6829243

A line process approach to penalized maximum-likelihood reconstruction for 3D SPECT. / Arrowood, Lloyd; Lee, Sanghyeb; Gregor, Jens.

2013 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013. Institute of Electrical and Electronics Engineers Inc., 2013. 6829243.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Arrowood, L, Lee, S & Gregor, J 2013, A line process approach to penalized maximum-likelihood reconstruction for 3D SPECT. in 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013., 6829243, Institute of Electrical and Electronics Engineers Inc., 2013 60th IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013, Seoul, Korea, Republic of, 10/27/13. https://doi.org/10.1109/NSSMIC.2013.6829243
Arrowood L, Lee S, Gregor J. A line process approach to penalized maximum-likelihood reconstruction for 3D SPECT. In 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013. Institute of Electrical and Electronics Engineers Inc. 2013. 6829243 https://doi.org/10.1109/NSSMIC.2013.6829243
Arrowood, Lloyd ; Lee, Sanghyeb ; Gregor, Jens. / A line process approach to penalized maximum-likelihood reconstruction for 3D SPECT. 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013. Institute of Electrical and Electronics Engineers Inc., 2013.
@inproceedings{86a997cd936c4a049e2c04fe47fb78b9,
title = "A line process approach to penalized maximum-likelihood reconstruction for 3D SPECT",
abstract = "Traditional SPECT imaging requires a trade-off between resolution and sensitivity. We show that it is possible to eliminate this trade-off and come close to achieving both goals simultaneously. Abstractly, small pinhole data is used to improve the resolution of co-registered large pinhole data which has higher sensitivity. Mathematically, the former is used to initialize a set of line processes that control the extent to which a truncated quadratic prior is applied to the latter. The idea builds on previous work by others on anatomic priors.",
author = "Lloyd Arrowood and Sanghyeb Lee and Jens Gregor",
year = "2013",
month = "1",
day = "1",
doi = "10.1109/NSSMIC.2013.6829243",
language = "English (US)",
isbn = "9781479905348",
booktitle = "2013 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
address = "United States",

}

TY - GEN

T1 - A line process approach to penalized maximum-likelihood reconstruction for 3D SPECT

AU - Arrowood, Lloyd

AU - Lee, Sanghyeb

AU - Gregor, Jens

PY - 2013/1/1

Y1 - 2013/1/1

N2 - Traditional SPECT imaging requires a trade-off between resolution and sensitivity. We show that it is possible to eliminate this trade-off and come close to achieving both goals simultaneously. Abstractly, small pinhole data is used to improve the resolution of co-registered large pinhole data which has higher sensitivity. Mathematically, the former is used to initialize a set of line processes that control the extent to which a truncated quadratic prior is applied to the latter. The idea builds on previous work by others on anatomic priors.

AB - Traditional SPECT imaging requires a trade-off between resolution and sensitivity. We show that it is possible to eliminate this trade-off and come close to achieving both goals simultaneously. Abstractly, small pinhole data is used to improve the resolution of co-registered large pinhole data which has higher sensitivity. Mathematically, the former is used to initialize a set of line processes that control the extent to which a truncated quadratic prior is applied to the latter. The idea builds on previous work by others on anatomic priors.

UR - http://www.scopus.com/inward/record.url?scp=84904164405&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84904164405&partnerID=8YFLogxK

U2 - 10.1109/NSSMIC.2013.6829243

DO - 10.1109/NSSMIC.2013.6829243

M3 - Conference contribution

SN - 9781479905348

BT - 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013

PB - Institute of Electrical and Electronics Engineers Inc.

ER -