Comparative analysis of wavelet based approaches for reliable removal of ocular artifacts from single channel EEG

Saleha Khatun, Ruhi Mahajan, Bashir I. Morshed

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Citations (Scopus)

Abstract

For biomedical and scientific fields, Electroencephalography (EEG) has turned out to be an important tool to understand, study, and utilize brain functionalities. To fully utilize EEG signals in real-life closed-loop applications, artifacts such as ocular must be removed. Wavelet transform is one of the powerful methods to remove ocular artifacts from single channel EEG devices. In this study, both stationary and discrete wavelet transforms (SWT and DWT, respectively) have been compared with various wavelet basis functions, such as sym3, haar, coif3, and bior4.4 using either universal threshold (UT) or statistical threshold (ST). Different combinations of wavelet transform techniques, mother wavelets, and thresholds are compared to identify an optimum combination for ocular artifact removal. Performance metrics like Correlation Coefficient (CC), Normalized Mean Square Error (NMSE), Time Frequency Analysis, and execution time have been calculated for measuring the effectiveness of each combination. According to CC, DWT+UT combination turned out to be a good option for the ocular artifact removal. However, according to NMSE and time frequency analysis, SWT+ST has generated better performance in keeping neural segments of EEG unaffected. According to the measurement of execution times, DWT+ST is faster compared to other combinations. The study shows that wavelet transform is suitable in artifact removal from single channel EEG data to implement in ambulatory real-time EEG systems.

Original languageEnglish (US)
Title of host publication2015 IEEE International Conference on Electro/Information Technology, EIT 2015
PublisherIEEE Computer Society
Pages335-340
Number of pages6
ISBN (Electronic)9781479988020
DOIs
StatePublished - Jun 10 2015
EventIEEE International Conference on Electro/Information Technology, EIT 2015 - Dekalb, United States
Duration: May 21 2015May 23 2015

Publication series

NameIEEE International Conference on Electro Information Technology
Volume2015-June
ISSN (Print)2154-0357
ISSN (Electronic)2154-0373

Other

OtherIEEE International Conference on Electro/Information Technology, EIT 2015
CountryUnited States
CityDekalb
Period5/21/155/23/15

Fingerprint

Electroencephalography
Wavelet transforms
Mean square error
Discrete wavelet transforms
Brain
Statistical methods

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Information Systems
  • Control and Systems Engineering
  • Electrical and Electronic Engineering

Cite this

Khatun, S., Mahajan, R., & Morshed, B. I. (2015). Comparative analysis of wavelet based approaches for reliable removal of ocular artifacts from single channel EEG. In 2015 IEEE International Conference on Electro/Information Technology, EIT 2015 (pp. 335-340). [7293364] (IEEE International Conference on Electro Information Technology; Vol. 2015-June). IEEE Computer Society. https://doi.org/10.1109/EIT.2015.7293364

Comparative analysis of wavelet based approaches for reliable removal of ocular artifacts from single channel EEG. / Khatun, Saleha; Mahajan, Ruhi; Morshed, Bashir I.

2015 IEEE International Conference on Electro/Information Technology, EIT 2015. IEEE Computer Society, 2015. p. 335-340 7293364 (IEEE International Conference on Electro Information Technology; Vol. 2015-June).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Khatun, S, Mahajan, R & Morshed, BI 2015, Comparative analysis of wavelet based approaches for reliable removal of ocular artifacts from single channel EEG. in 2015 IEEE International Conference on Electro/Information Technology, EIT 2015., 7293364, IEEE International Conference on Electro Information Technology, vol. 2015-June, IEEE Computer Society, pp. 335-340, IEEE International Conference on Electro/Information Technology, EIT 2015, Dekalb, United States, 5/21/15. https://doi.org/10.1109/EIT.2015.7293364
Khatun S, Mahajan R, Morshed BI. Comparative analysis of wavelet based approaches for reliable removal of ocular artifacts from single channel EEG. In 2015 IEEE International Conference on Electro/Information Technology, EIT 2015. IEEE Computer Society. 2015. p. 335-340. 7293364. (IEEE International Conference on Electro Information Technology). https://doi.org/10.1109/EIT.2015.7293364
Khatun, Saleha ; Mahajan, Ruhi ; Morshed, Bashir I. / Comparative analysis of wavelet based approaches for reliable removal of ocular artifacts from single channel EEG. 2015 IEEE International Conference on Electro/Information Technology, EIT 2015. IEEE Computer Society, 2015. pp. 335-340 (IEEE International Conference on Electro Information Technology).
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